Silicon ICP standard

Analysis Note
1000 mg/L Si in 2% sodium hydroxide, preparedwith high-purity SiO2, NaOH, and water
Application
Silicon ICP standard can be used as a calibration standard in the determination of silicon concentration in organosilica materials by inductively coupled plasma optical emission spectroscopy (ICP-OES).[1] General description
This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.
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Download your certificate at http://www.sigma-aldrich.com to view certified values, including uncertainty, date of expiry, and detailed information about trace impurities.
Other Notes
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Legal Information
CERTIPUR is a registered trademark of Merck KGaA, Darmstadt, Germany